CEM DT-156H Coating Thickness Tester

The CEM DT-156H Coating Thickness Tester is designed to accurately measure the thickness of coatings on both ferrous and non-ferrous metals.

SKU:81630

MME Shopping Event

Hurry and get discounts on Most of MME Products up to 20%

Call for Price

12People watching this product now!

CEM DT-156H Coating Thickness Tester

The CEM DT-156H Coating Thickness Tester is designed to accurately measure the thickness of coatings on both ferrous and non-ferrous metals. This tool is particularly useful in sectors such as automotive, construction, aerospace, and any other industry requiring precise measurement of paint or coating thickness for quality assurance purposes.

CEM DT-156H Key Features

  • Non-magnetic coatings (e.g. paint, zinc) on steel
  • Insulating coatings (e.g. paint) on no-ferrous metals
  • No-ferrous metals coatings on insulating substrates
  • Menu operation system
  • Two working modes: DIRECT and GROUP mode
  • One point calibration, two points calibration and basic calibration easily
  • Memory for 1500 readings ( 30 GROUP readings)
  • Delete single readings and all group readings easily
  • Low battery, error indication
  • USB interface for PC software
  • 4 levels of battery indication
  • Error indication
  • Easily adapt to lighting conditions with 8 levels of backlight

CEM DT-156H Specifications

SpecificationsDT-156DT-156H
Sensor probeFNFN
Working principlemagnetic inductionEddy current principlemagnetic inductionEddy current principle
Measuring range0~1250um0~1250um0~1350um0~1350um
Guaranteed tolerance (of reading)(+/- 3%+1)um(+/- 3%+1.5)um(+/- 2.5%+2)um(+/- 2.5%+2)um
Repeatability(+/- 1%+1)um(+/- 1%+1)um(+/- 1%+1)um(+/- 1%+1)um
Low range Precision0.1um0.1um0.1um0.1um
Minimum curvature radius1.5mm3mm1.5mm3mm
Diameter of Minimum area7mm5mm7mm5mm
Basic critical thickness0.5mm0.3mm0.5mm0.3mm

 

0 reviews
0
0
0
0
0

There are no reviews yet.

Be the first to review “CEM DT-156H Coating Thickness Tester”

Brand

Cem

CEM Corporation Overview

CEM Corporation, founded in 1978, is renowned for its pioneering contributions to scientific instrumentation with a focus on microwave-based technology for laboratory and research applications. The founders—Dr. Michael J. Collins (Chemist), Ronald Goetchius (Electrical Engineer), and Bill Cruse Jr. (Mechanical Engineer)—launched the company with a novel concept for microwave drying that significantly expedited moisture and solids analysis processes from hours down to minutes, which was a groundbreaking improvement at the time.

Product Innovation and Evolution

Over the years, CEM Corporation has expanded its product offerings beyond its original microwave moisture/solids analysis systems. Their portfolio now includes systems for:
  • Acid digestion for elemental analysis
  • Compositional testing of food products
  • Peptide and chemical synthesis
The company's dedication to innovation is reflected in their development of a diverse range of instruments suited for various applications from academic research to industrial quality control.
cem logo

Datasheet

Mme-Pdfs-Image

Specifications